Speciation of activators in electroluminescent thin films: an EXAFS study of cerium and terbium doped strontium sulfide

摘要

Extended X-ray absorption fine structure (EXAFS) was used to determine the local structure of the luminescent centers in Tb3+ and Ce3+ -doped strontium sulfide thin films deposited by Atomic Layer Epitaxy (ALE). The rare earths were observed to enter mainly the substitutional sites but at the same time a part of the atoms form RES clusters (RE = rare earth). The presence of both substitutional sites and RES clusters has been observed for the first time in this study for rare earths in II-VI compounds. [References: 33]