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首页> 外文期刊>Ferroelectrics: Letters Section >Resistivity Characteristics of Plastic Multi-Barrier ITO Film by the Bending Process
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Resistivity Characteristics of Plastic Multi-Barrier ITO Film by the Bending Process

机译:塑料多壁ITO薄膜弯曲特性的电阻率特性

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摘要

We studied transmittance and electrical resistivity characteristics regarding bending of four other multi-barrier Indium tin oxide (ITO) film. Transmission showed there was about large 90 percent transmission above 550 nm wavelength at three multi-barrier structures. But, both-side hard coated structure showed relatively low 75 percent transmission above 550 nm wavelength. Also, resistivity change of four other multi-barrier film showed there was the lowest change at one-side hardcoat structure and the resistivity change of the center was larger than that of the edge.
机译:我们研究了与其他四个多势垒铟锡氧化物(ITO)膜弯曲有关的透射率和电阻率特性。透射表明,在三种多壁垒结构下,在550 nm波长以上大约有90%的透射率。但是,双面硬涂层结构在550 nm波长以上显示出相对较低的75%透射率。另外,另外四个多阻挡膜的电阻率变化显示在一侧硬涂层结构上变化最小,并且中心的电阻率变化大于边缘的电阻率变化。

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