Pyroelectric Properties of Sr_(0.6)Ba_(0.4)Nb_2O_6 Thin Films

摘要

Pyroelectric properties of Sr_xBa_(1-x)Nb_2O_6(x = 0.6 or 0.3) films, i.e. Sr_(0.6)Ba_(0.4) Nb_2O_6(SBN60) films with Sr_(0.3)Ba_(0.7)Nb_2O_6 (SBN30) seed-layer, deposited on Pt(100)/TiO_2/SiO_2/Si(100) substrate using ion beam sputtering were studied. The effect of crystallization and orientation behavior of SBN films was examined in some detail. The emphasis was placed on the pyroelectric effect measurement of the films without poling treatment. We have found that this could be realized from the films textured with non-zero component in the direction of polarization.