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Interfacial Natures and Controlling Morphology of Co Oxide Nanocrystal Structures by Adding Spectator Ni Ions

机译:添加旁观者镍离子对钴氧化物纳米晶体结构的界面性质和形貌控制

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摘要

Cobalt oxide nanostructure materials have been prepared by adding several concentrations of spectator Ni ions in solution, and analyzed by electron microscopy, X-day diffraction, calorimetry/thermogravimetric analysis, UV-vis absorption, Raman, and X-ray photoelectron spectroscopy. The electron microscopy results show that the morphology of the nanostructures is dramatically altered by changing the concentration of spectator ions. The bulk XRD patterns of 350 °C-annealed samples indicate that the structure of the cobalt oxide is all of cubic Fd-3m C03O4, and show that the major XRD peaks shift slightly with the concentration of Ni ions. In Raman spectroscopy, we can confirm the XRD data through a more obvious change in peak position, broadness, and intensity. For the un-sputtered samples in the XPS measurement process, the XPS peaks of Co 2p and O 1s for the samples prepared without Ni ions exhibit higher binding energies than those for the sample prepared with Ni ions. Upon Ar~+ ion sputtering, we found C03O4 reduces to CoO, on the basis of XPS data. Our study could be further applied to controlling morphology and surface oxidation state.
机译:氧化钴纳米结构材料是通过在溶液中添加多种浓度的观众Ni离子而制备的,并通过电子显微镜,X天衍射,量热/热重分析,紫外可见吸收,拉曼和X射线光电子能谱进行分析。电子显微镜结果表明,通过改变旁观者离子的浓度,纳米结构的形态发生了显着变化。 350℃退火样品的整体XRD图谱表明,氧化钴的结构全部为立方Fd-3m CO3O4,并显示主要XRD峰随Ni离子浓度的变化而略有偏移。在拉曼光谱中,我们可以通过峰位置,宽度和强度的更明显变化来确认XRD数据。对于XPS测量过程中未溅射的样品,不含Ni离子的样品的Co 2p和O 1s的XPS峰具有比含Ni离子的样品更高的结合能。在Ar〜+离子溅射后,根据XPS数据,我们发现CO3O4还原为CoO。我们的研究可进一步应用于控制形态和表面氧化态。

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