首页> 外文期刊>Bulletin of the Korean Chemical Society >Indium Sulfide and Indium Oxide Thin Films Spin-Coated from Triethylammonium Indium Thioacetate Precursor for n-Channel Thin Film Transistor
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Indium Sulfide and Indium Oxide Thin Films Spin-Coated from Triethylammonium Indium Thioacetate Precursor for n-Channel Thin Film Transistor

机译:由三乙铵硫乙酸铟前体旋涂的硫化铟和氧化铟薄膜,用于n沟道薄膜晶体管

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摘要

The In2S3 thin films of tetragonal structure and In2O3 films of cubic structure were synthesized by a spin coating method from the organometallic compound precursor triethylammonium indium thioacetate ([(Et)3NH]~+[In(SCOCH3)4]~-; TEA-TnTAA). In order to determine the electron mobility of the spin-coated TEA-InTAA films, thin film transistors (TFTs) with an inverted structure using a gate dielectric of thermal oxide (SiO2) was fabricated. These devices exhibited n-channel TFT characteristics with a field-effect electron mobility of 10.1 cm~2V~(-1)s~(-1) at a curing temperature of 500 °C, indicating that the semiconducting thin film material is applicable for use in low-cost, solution-processed printable electronics.
机译:利用有机金属化合物前驱体三乙基铵硫代乙酸铟([(Et)3NH]〜+ [In(SCOCH3)4]〜-; TEA-TnTAA通过旋涂法合成了四方结构的In2S3薄膜和立方结构的In2O3薄膜)。为了确定旋涂的TEA-InTAA膜的电子迁移率,使用热氧化物(SiO2)的栅极电介质制作了具有反向结构的薄膜晶体管(TFT)。这些器件在500°C的固化温度下具有n沟道TFT特性,场效应电子迁移率为10.1 cm〜2V〜(-1)s〜(-1),表明该半导体薄膜材料适用于用于低成本,溶液加工的可印刷电子产品。

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