首页> 外文期刊>Experimental Mechanics >In-Situ Mechanical Testing for Characterizing Strain Localization During Deformation at Elevated Temperatures
【24h】

In-Situ Mechanical Testing for Characterizing Strain Localization During Deformation at Elevated Temperatures

机译:在高温下表征变形过程中应变局部化的原位机械测试

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

An experimental methodology has been developed to characterize local strain heterogeneities in alloys via in-situ scanning electron microscope (SEM) based mechanical testing. Quantitative measurements of local strains as a function of grain orientation, morphology and neighborhood are crucial for mechanistic understanding and validation of crystal plasticity models. This study focuses on the technical challenges associated with performing creep tests at elevated temperatures ≤700°C in an SEM. Samples of nickel-based superalloy Rene 104 were used for this study, but the technique is applicable to testing of any metal samples at elevated temperature. Electron beam lithography was employed to produce a suitable surface speckle pattern of hafnium oxide to facilitate full field displacement measurements using a commercial software package. The speckle pattern proved to have good thermal stability and provided excellent contrast for image acquisition using secondary electron imaging at elevated temperature. The speckle pattern and microscope magnification were optimized to obtain the resolution necessary to discern strain localizations within grain interiors and along grain boundaries. Minimum strain resolution due to SEM image distortions was determined prior to tensile testing, and image integration methods were utilized to minimize imaging artifacts. Limitations due to the present specimen heating method and potential solutions to these limitations are also addressed.
机译:已经开发了一种实验方法来通过基于原位扫描电子显微镜(SEM)的机械测试来表征合金中的局部应变异质性。局部应变作为晶粒取向,形态和邻域的函数的定量测量对于机械理解和验证晶体可塑性模型至关重要。这项研究的重点是与在SEM中在≤700°C的高温下进行蠕变测试有关的技术挑战。镍基超级合金Rene 104的样品用于本研究,但该技术适用于在高温下测试任何金属样品。电子束光刻被用来产生合适的氧化oxide表面斑点图案,以利于使用商业软件包进行全场位移测量。斑点图案被证明具有良好的热稳定性,并为在高温下使用二次电子成像的图像采集提供了出色的对比度。优化了斑点图案和​​显微镜放大倍数,以获得分辨晶粒内部和沿晶粒边界的应变局部化所必需的分辨率。在拉伸测试之前,确定了由于SEM图像变形而导致的最小应变分辨率,并且采用了图像积分方法来最大程度地减少成像伪影。还解决了由于当前样品加热方法引起的限制以及针对这些限制的潜在解决方案。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号