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X-ray characterization of thin foil gold mirrors of a soft X-ray telescope for ASTROSAT

机译:用于ASTROSAT的软X射线望远镜的薄箔金镜的X射线表征

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X-ray reflectivity measurements were performed on several thin foil gold mirrors fabricated in TIFR for a Soft X-ray Imaging Telescope. The mirrors were made from thin aluminum foils with a reflecting layer of sputtered gold transferred from a smooth glass mandrel using an epoxy. X-ray reflectivity measurements were performed on a sample of randomly selected mirrors using CuK_α (8.05 keV), CrK_α (5.41 keV) X-rays and also at several energies in the energy range of 155-300 eV using the synchrotron source Indus-1. It was found that the roughness of the low-density top gold layer as obtained from the fitting of X-ray reflectivity data for CuK_α radiation is relatively more as compared to that obtained from the CrK_α radiation. This indicates that in the mirrors made by this process, the upper surfaces are smoother as compared to the deeper layers. It was also observed that the critical angle almost vanishes in the very low energy range of 290-300 eV due to strong absorption effects of the low density material sitting on top of these mirrors. Due to this absorption effect, efficiency of these mirrors reduces in this energy range. This is first time that reflectivity measurements are being reported for very soft X-rays (≤ 300 eV) for mirrors made for any X-ray astronomy mission.
机译:X射线反射率测量是在TIFR中为软X射线成像望远镜制造的几个薄箔金镜上进行的。镜子是由薄铝箔制成的,其上有一层溅镀金的反射层,是用环氧树脂从光滑的玻璃心轴上转移过来的。使用CuK_α(8.05 keV),CrK_α(5.41 keV)X射线对随机选择的反射镜样品进行X射线反射率测量,还使用同步加速器源Indus-1在155-300 eV能量范围内的多个能量下进行X射线反射率测量。已经发现,通过拟合CuK_α辐射的X射线反射率数据所获得的低密度顶层金层的粗糙度与通过CrK_α辐射获得的粗糙度相比相对更大。这表明在通过该方法制成的镜子中,与较深的层相比,上表面更平滑。还观察到,由于位于这些反射镜顶部的低密度材料的强烈吸收作用,临界角在290-300 eV的非常低的能量范围内几乎消失了。由于这种吸收效应,这些反射镜的效率在该能量范围内降低。这是首次报告用于任何X射线天文学任务的反射镜的非常柔和的X射线(≤300 eV)的反射率测量结果。

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