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Influence of temperature and voltage on electrochemical reduction of graphene oxide

机译:温度和电压对氧化石墨烯电化学还原的影响

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摘要

In this paper, the influence of temperature and voltage on direct electrochemical reduction were discussed in detail. Reduced graphene oxide is characterized with X-ray diffraction (XRD), fourier transform infrared spectroscopy (FT-IR) and field emission scanning electron microscopy (FE-SEM). It is found that the reduction degree of graphene oxide (GO) decreases gradually with the increase of applied temperature. The optimal applied temperature found in our experiment is 20℃; Meanwhile, as the applied voltage increases from 0-1 to 12-5 V, the reduction degree of graphene oxide increases gradually. However, above 2-5 V, increasing voltage has little effect on the reduction degree of graphene oxide.
机译:本文详细讨论了温度和电压对直接电化学还原的影响。还原的氧化石墨烯的特征在于X射线衍射(XRD),傅立叶变换红外光谱(FT-IR)和场发射扫描电子显微镜(FE-SEM)。发现随着施加温度的升高,氧化石墨烯(GO)的还原度逐渐降低。我们的实验中发现的最佳应用温度为20℃。同时,随着施加电压从0-1V增加到12-5V,氧化石墨烯的还原度逐渐增加。但是,高于2-5 V时,增加电压对氧化石墨烯的还原度影响很小。

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