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首页> 外文期刊>Bulletin of Materials Science >Surface texture modification of spin-coated SiO_2 xerogel thin films by TMCS silylation
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Surface texture modification of spin-coated SiO_2 xerogel thin films by TMCS silylation

机译:TMCS硅烷基化改性旋涂SiO_2干凝胶薄膜的表面纹理

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摘要

The SiO_2 xerogel thin films were deposited successfully by sol-gel technique via the acid-catalyzed hydrolysis and condensation of tetraethylorthosilicate (TEOS) with ethanol as a solvent. Further, the deposited thin films were treated wet chemically by trimethylchlorosilane (TMCS) and hexane solution with 10% and 15% volume ratio to remove the hydroxyl groups from the surface of deposited SiO_2 thin films. These as deposited and surface-modified films were characterized by ellipsometer, Fourier transform infrared (FTIR) spectrometer and contact angle meter. The presence of 2900 and 850 cm~(-1) peaks of CH3 vibrations in FTIR spectra of surface-modified films confirms the hydrphobisation of SiO_2 surface. The maximum contact angle of 108-7° was observed for the surface-modified film at 10% TMCS.
机译:SiO_2干凝胶薄膜通过溶胶-凝胶技术通过酸催化水解和原硅酸四乙酯(TEOS)与乙醇为溶剂缩合而成功沉积。此外,用三甲基氯硅烷(TMCS)和己烷溶液以10%和15%的体积比对沉积的薄膜进行化学湿处理,以从沉积的SiO 2薄膜的表面除去羟基。通过椭偏仪,傅立叶变换红外(FTIR)光谱仪和接触角仪对这些沉积和表面改性的膜进行了表征。在表面改性膜的FTIR光谱中,CH3振动的2900和850 cm〜(-1)峰的存在证实了SiO_2表面的疏水化。对于10%TMCS下的表面改性膜,观察到最大接触角为108-7°。

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