Analysis levels within the SINTAP defect assessment procedures

摘要

Within the SINTAP defect assessment procedures, there are a number of levels of analysis. An increase in level corresponds to increased complexity and requires more detailed data but also leads to improved accuracy. Some levels of analysis are based on existing procedures such as the R6 approach used in the UK nuclear industry and the engineering treatment model developed in Germany. Other levels have been derived during the course of the SINTAP project. In this paper, the levels of analysis for homogeneous components are described and the background to their derivation is discussed. The resulting approaches are illustrated by examples for a range of engineering metals.