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首页> 外文期刊>Electrochimica Acta >In-situ grazing incidence X-ray diffractometry of polycrystalline copper in alkaline chloride and sulphate electrolytes
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In-situ grazing incidence X-ray diffractometry of polycrystalline copper in alkaline chloride and sulphate electrolytes

机译:碱性氯化物和硫酸盐电解质中多晶铜的原位掠入射X射线衍射法

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摘要

ln-situ grazing incidence X-ray diffractometry (GIXD) was used to study the electrochemical oxidation and reduction of copper in solutions at pH 9, 12 and 14. Crystalline Cu2O and CuO films down to thicknesses of tens of nanometers were detected under such conditions, whereas a crystalline Cu(OH)(2) phase did not occur. The formation rate of crystalline Cu2O films increases with pH and formation time. In the Cu(II) potential region, Cu2O can coexist with amorphous Cu(OH)(2) phases. Crystalline CuO is not formed directly. At pH 14, it occurs by slow conversion of Na2CuO2 precipitates. Crystalline CuCl formation takes place only in the Cu(II) potential region at pH 9. (C) 1998 Published by Elsevier Science Ltd. All rights reserved. [References: 14]
机译:原位掠入射X射线衍射(GIXD)用于研究pH,9、12和14溶液中铜的电化学氧化和还原。在这种条件下,检测到厚度为数十纳米的Cu2O和CuO薄膜。 ,而没有出现结晶的Cu(OH)(2)相。 Cu2O结晶膜的形成速率随pH和形成时间的增加而增加。在Cu(II)电位区域中,Cu2O可与非晶Cu(OH)(2)相共存。不会直接形成结晶的CuO。在pH 14时,它是通过缓慢转化Na2CuO2沉淀而发生的。 CuCl的结晶仅在pH 9的Cu(II)电位区域内发生。(C)1998由Elsevier Science Ltd.发布。保留所有权利。 [参考:14]

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