FEI LAUNCHES APREO HIGH-PERFORMANCE SEM

Larry Wagner

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FEI LAUNCHES APREO HIGH-PERFORMANCE SEM

机译：Fe i launches Apr EO high-performance SEM

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FEI (Hillsboro, Ore.) announced the new Apreo scanning electron microscope (SEM), offering an industry-leading range of applications. Apreo offers exceptional versatility in fields ranging from materials and life sciences to research in semiconductors, energy, and chemistry.

机译：FEI（俄勒冈州希尔斯伯勒）宣布推出新型Apreo扫描电子显微镜（SEM），提供一系列行业领先的应用。 Apreo在从材料和生命科学到半导体，能源和化学研究的领域提供了卓越的多功能性。

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《Electronic Device Failure Analysis: A Resource for Technical Information and Industry Developments 》 |2016年第3期| 共3页
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Larry Wagner;
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FEI LAUNCHES APREO HIGH-PERFORMANCE SEM

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