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Type I Error Inflation in DIF IdentificationWith Mantel-Haenszel: An Explanation and a Solution

机译:使用Mantel-Haenszel进行DIF识别中的I型错误膨胀:解释和解决方案

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摘要

It is known that sum score-based methods for the identification of differential item functioning (DIF), such as the Mantel-Haenszel (MH) approach, can be affected by Type I error inflation in the absence of any DIF effect. This may happen when the items differ in discrimination and when there is item impact. On the other hand, outlier DIF methods have been developed that are robust against this Type I error inflation, although they are still based on the MH DIF statistic. The present article gives an explanation for why the common MH method is indeed vulnerable to the inflation effect whereas the outlier DIF versions are not. In a simulation study, we were able to produce the Type I error inflation by inducing item impact and item differences in discrimination. At the same time and in parallel with the Type I error inflation, the dispersion of the DIF statistic across items was increased. As expected, the outlier DIF methods did not seem sensitive to impact and differences in item discrimination.
机译:众所周知,在没有任何DIF效果的情况下,I型错误膨胀会影响基于总分的差分项功能(DIF)识别方法,例如Mantel-Haenszel(MH)方法。当项目的区分程度不同并且有项目影响时,可能会发生这种情况。另一方面,尽管仍基于MH DIF统计数据,但已开发出了针对此I型错误膨胀具有鲁棒性的离群DIF方法。本文解释了为什么普通的MH方法确实容易受到通货膨胀效应的影响,而离群的DIF版本则不然。在模拟研究中,我们能够通过引起项目影响和项目差异来产生I型错误膨胀。同时,与I型错误膨胀同时出现的是,DIF统计量在各项之间的分散也有所增加。不出所料,异常DIF方法似乎对项目歧视的影响和差异不敏感。

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