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Linearity Study of a Spectral Emissivity Measurement Facility

机译:光谱发射率测量装置的线性研究

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Linearity is one of the important characteristics of a spectral radiation measurement facility. Basically, it depends on the linearity of the spectral responsivity of the detector and amplifier at different wavelengths. As spectral emissivity is measured over wide wavelength and temperature ranges and the detection system has significant drift and noise, it is not easy to measure the linearity of this facility accurately using only one standard radiator. A simple double-blackbody method has been adopted to simulate reference emissivity samples and test the linearity of the spectral emissivity measurement facility developed at the National Institute of Metrology. Good linearity results were obtained from 3μm to 15μm. This method minimizes the influence of drift on the emissivity measurement over a wide ratio of measurement signals and wide spectral range.
机译:线性是光谱辐射测量设备的重要特性之一。基本上,它取决于检测器和放大器在不同波长下的光谱响应线性。由于光谱发射率是在很宽的波长和温度范围内测量的,并且检测系统具有明显的漂移和噪声,因此仅使用一个标准辐射器准确测量该设备的线性并不容易。已采用一种简单的双黑体方法来模拟参考发射率样本并测试由国家计量学会开发的光谱发射率测量设备的线性。在3μm至15μm范围内获得了良好的线性结果。该方法可在较大比例的测量信号和较宽的光谱范围内将漂移对发射率测量的影响降至最低。

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