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首页> 外文期刊>International Journal of Wavelets, Multiresolution and Information Processing >AN ANALYSIS METHOD FOR SAMPLING IN SHIFT-INVARIANT SPACES
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AN ANALYSIS METHOD FOR SAMPLING IN SHIFT-INVARIANT SPACES

机译:不变空间中的抽样分析方法

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摘要

A subspace V of L{sub}2(R) is called shift-invariant if it is the closed linear span of integer-shifted copies of a single function. As a complement to classical analysis techniques for sampling in such spaces, we propose a method which is based on a simple interpolation estimate of a certain coefficient mapping. Then we use this method to derive both new results and relatively simple proofs of some previously known results. Among these are some results of rather general nature and some more specialized results for B-spline wavelets. The main problem under study is to find a shift X{sub}0 and an upper bound δ such that any function f ∈ V can be reconstructed from a sequence of sample values (f(x{sub}0 + k +δ{sub}k)){sub}(k ∈ z), either when all δ{sub}k = 0 or in the irregular sampling case with an upper bound sup{sub}k |δ{sub}k| < δ.
机译:如果L {sub} 2(R)的子空间V是单个函数的整数移位副本的闭合线性范围,则称为移位不变。作为对在此类空间中采样的经典分析技术的补充,我们提出了一种基于特定系数映射的简单插值估计的方法。然后,我们使用此方法来导出新结果和一些先前已知结果的相对简单证明。在这些结果中,有一些具有相当普遍的性质,而一些B样条小波的结果更为专业。研究中的主要问题是找到位移X {sub} 0和上限δ,以便可以从一系列样本值(f(x {sub} 0 + k +δ{sub } k)){sub}(k∈z),或者当所有δ{sub} k = 0时,或者在不规则采样的情况下,上限为sup {sub} k |δ{sub} k | <δ。

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