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首页> 外文期刊>科儀新知 >When a Nano-Probe Engineer Meet a New Type of AFM-a Novel Analysis Technology for Surface Property
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When a Nano-Probe Engineer Meet a New Type of AFM-a Novel Analysis Technology for Surface Property

机译:当纳米探针工程师遇到一种新型的AFM-一种新型的表面特性分析技术

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摘要

The new type of atomic force microscopy is becoming more prevalent. The powerful functions make it easier to study physical properties of surfaces. Some information such as elastic modulus, deformation, and adhesion can be obtained at the same time without compromising highest resolution. In this study, mechanic property measurement of soft matter is conducive to biomaterials development. By modifying AFM tips with functional groups, the recognition of specific surface properties is achieved, that is molecular recognition force microscopy. Our laboratory had developed several functional tips which can distinguish hydrophilic or hydrophobic surfaces, antifouling efficacy and so on. In this study we provide a method for determining the antifouling ability of a material surface, which is based on AFM with pollutant-coated AFM probes. We also improve the anti-stick property of AFM probe and extend probe's life time, which solves the stickiness problems when scanning polymer samples. We expect this technology can significantly shorten the time of developing new materials for the manufacture and speed the implementation of the novel technology in industry.
机译:新型原子力显微镜正变得越来越普遍。强大的功能使研究表面的物理特性变得更加容易。可以同时获得一些信息,例如弹性模量、变形和附着力,而不会影响最高分辨率。本研究对软物质的力学性能测量有利于生物材料的发展。通过用官能团修饰AFM针尖,实现了对特定表面特性的识别,即分子识别力显微镜。我们的实验室开发了几种功能吸头,可以区分亲水或疏水表面、防污功效等。在这项研究中,我们提供了一种确定材料表面防污能力的方法,该方法基于带有污染物涂层的AFM探针的AFM。我们还改进了探针的防粘性能,延长了探针的使用寿命,解决了扫描聚合物样品时的粘性问题。我们预计这项技术可以大大缩短开发制造新材料的时间,并加快新技术在工业中的实施。

著录项

  • 来源
    《科儀新知》 |2017年第211期|89-96|共8页
  • 作者

    Feng-Sheng Kao; Jen-You Chu;

  • 作者单位

    Material and Chemical Research Laboratories, Industrial Technology Research Institute;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 汉语
  • 中图分类 仪器、仪表;
  • 关键词

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