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Terahertz pulsed imaging and near infrared imaging to monitor the coating process of pharmaceutical tablets.

机译:太赫兹脉冲成像和近红外成像可监控药物片剂的包衣过程。

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摘要

Terahertz pulsed imaging (TPI) and near infrared (NIR) imaging were used to non-destructively monitor the coating process of film-coated tablets. Samples that were taken from a pan coater at different time points were analyzed by both methods. TPI provided coating thickness maps over the whole surface of the tablets, determining the thickness of the coating at each point of the sample surface in mum, this way also giving information about the coating uniformity. The growth of the coating during the coating process was shown. NIR imaging did not provide direct thickness values, but by different absorbance values, inter- and intra-tablet differences were shown. Thus, coating thickness information was also obtained in a way that different tablets could be compared. The growth of the coating layer during the process was shown as well. Both methods provided comparable results; and they were able to detect small defects in the coating. With TPI, the whole tablet surface could be scanned; with NIR imaging information about the tablet ends at the center-band was not obtained due to the strong curvature. NIR imaging proved to be better at thinner coating layers and had a higher spatial resolution whereas TPI had the clear advantage that it provided direct thickness values.
机译:太赫兹脉冲成像(TPI)和近红外(NIR)成像用于无损监测薄膜包衣片剂的包衣过程。通过两种方法分析了在不同时间点从锅式涂布机上采集的样品。 TPI提供了片剂整个表面上的包衣厚度图,从而确定了样品表面每个点的包衣厚度(以妈妈为单位),这样还可以提供有关包衣均匀性的信息。显示了在涂覆过程中涂层的生长。 NIR成像未提供直接的厚度值,但通过不同的吸光度值,显示了片剂之间和片剂内部的差异。因此,还可以通过比较不同片剂的方式获得包衣厚度信息。还显示了在该过程中涂层的生长。两种方法均提供了可比的结果。他们能够检测涂层中的细小缺陷。使用TPI,可以扫描整个平板电脑的表面;使用NIR成像时,由于曲率较大,因此无法获得有关药片在中心带的信息。 NIR成像在较薄的涂层上表现更好,并且具有更高的空间分辨率,而TPI具有明显的优势,即可以提供直接的厚度值。

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