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Analysis of sulfur and carbon isotope ratios in mixed matrices by secondary ion mass spectrometry: Implications for mass bias corrections

机译:通过二次离子质谱分析混合基质中的硫和碳同位素比:质量偏差校正的含义

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摘要

The effects of mixed matrices on mass bias during the measurement of ~(34)S/~(32)S and ~(13)C/~(12)C ratios by secondary ion mass spectrometry were investigated. Four samples consisting of fine-grained mixtures of 50-95 wt ‰ carbonate, 5-50‰ iron sulfide, and 0-5‰ iron oxide were analyzed. The measured δ~(34)S and δ~(13)C values on all four samples were identical within analytical error, and were identical to the values of the pure sulfide and carbonate minerals. These results indicate that, even for materials that are smaller than the primary ion beam contained in a matrix of different composition, it is possible to calibrate mass bias by using coarse-grained mineral standards.
机译:研究了二次离子质谱法测量〜(34)S /〜(32)S和〜(13)C /〜(12)C比时混合基质对质量偏向的影响。分析了由50-95 wt%碳酸盐,5-50‰硫化铁和0-5‰氧化铁的细颗粒混合物组成的四个样品。在分析误差范围内,所有四个样品的δ〜(34)S和δ〜(13)C值均相同,并且与纯硫化物和碳酸盐矿物的值相同。这些结果表明,即使对于小于组成不同的基质中包含的一次离子束的材料,也可以通过使用粗粒矿物标准品来校准质量偏差。

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