We survey recent results on electronic noise in nanostructured devices. Three kinds of excess noise referring to hot-carriers in submicron n{sup}+nn{sup}+ diodes, shot noise in mesoscopic structures, resistance fluctuations in thin film conductors, are considered. The influence of down-sizing on fluctuations is illustrated in each case.
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机译：我们调查了有关纳米结构器件中电子噪声的最新结果。考虑了涉及亚微米n {sup} + nn {sup} +二极管中热载流子的三种过量噪声，介观结构中的散粒噪声，薄膜导体中的电阻波动。分别说明了缩小尺寸对波动的影响。
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