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首页> 外文期刊>journal of applied physics >Measurement of properties of thenlayer in hydrogenated amorphous silicon solar cells
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Measurement of properties of thenlayer in hydrogenated amorphous silicon solar cells

机译:Measurement of properties of thenlayer in hydrogenated amorphous silicon solar cells

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By measuring flathyphen;band voltage as a function of light intensity it is possible to get information about the transport properties of an intact solar cell. We illustrate different kinds of behavior and show how these are related to solar cell performance.

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