Correlation of blister diameter and blister skin thickness for helium‐bombarded V

摘要

A correlation of the most probable blister diameterDmpand mean blister skin thicknesstfor helium‐ion‐irradiated annealed polycrystalline and monocrystalline V (100) surfaces yields a relationshipDmp∝t0.89. This relationship is different from the relationshipDmp∝t1.5suggested by other authors for vanadium. The relationship observed in the present studies does not support the lateral stress model for blister formation, which predictsDmp∝t1.5. Evidence is presented for blister formation by internal gas pressure, as suggested earlier by the present authors.