Analysis of SFDR Using Power Spectrum Based on Wavelet Extraction

摘要

The high frequency of advanced digital signal processing and data analysis in wide range of everyday data computing applications has propagated the uses of Analog to Digital Converters. However, such a converter can be very crucial and critical for some applications. Especially with the use of sensitive equipment's, errors or deviations from original signal could lead to catastrophic results. Therefore, testing output signal for dynamic parameters can always define the performance of the converters. In this research, the dynamic range parameters of Spurious-Free Dynamic Range will be tested using FFT testing application process based on Wavelet decomposition algorithms. This new proposes testing technique will utilize Wavelet special characteristic of decomposition feature, reduce compiling sample data, and expedite testing process. The new propose testing technique will be compared with conventional method of FFT application in term of accuracy, variance, and number of collect and computed samples.