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Fault diagnosis for RAMs using Walsh transform

机译:Fault diagnosis for RAMs using Walsh transform

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摘要

In this paper, we show a method to locate single-stuck at fault for random access memory (RAM). From the fail-bitmaps of the memory, we obtain the Walsh transform of them. For single-stuck at faults, we show that the fault can be located by using only the 0th and 1st coefficients of the spectrum The computation time is O(n×2{sup}n), where n is the number of bits in the address. Thus, we can quickly locate the faults.

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