Simultaneous extraction of bulk lifetime and surface recombination velocities from free carrier absorption transients

摘要

Bulk lifetime and surface recombination velocities at both the front and the rear surfaces are important parameters that affect the performance of solar cells. In an earlier work lsqb;G. S. Kousik, Z. G. Ling and P. K. Ajmera, J. Appl. Phys.72, 141 (1992)rsqb;, a detailed theoretical analysis for a contactless nondestructive technique to obtain these parameters is presented. Here, the experimentally measured data using this new approach was presented. Moreover, the earlier analytical work has now been extended to also provide an estimate of the sensitivity of the extracted parameters to errors in experimental measurements. Results on measurements on single crystal silicon wafers are provided as an example.