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Public at risk from safety design gap

机译:Public at risk from safety design gap

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摘要

DEATHS AND INJURIES from electronic products and systems will rise to unacceptable levels unless industry addresses a gap in international standards covering the treatment of electromagnetic compatibility (EMC) in safety designs, the IET has warned. Responding to a situation that it says is partly the result of decisions by international standards committees, the IET has updated guidelines on EMC for functional safety that it first published in 2000.

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