Misorientation Dependence of Energies of Si(001) Twist Grain Boundaries

摘要

The energies of Si(001) twist boundaries have been measured relative to Si(solid)-Sn(liquid) interfacial energies by a dihedral angle method at 1473 K. Shallow and wide width energy cusps were found at non-coincidence site lattice (csl)-misorientations, in addition to shallow and narrow width energy cusps at csl-misorientations with low Σ. These wide width cusps existed at misorientations dividing, into 1:1 or 1:2, misorientation differences between two csl-misorientations. The energy of the general boundaries discontinuously varied with misorientations across the wide cusps. These misorientations divided the whole misorientation region with respect to energies.