Use of an CXP8 X-ray Streak Camera for Measuring the Time Characteristics of X Rays Emitted by a Laser Plasma

摘要

The time dependence of the X-ray intensity from targets exposed to single-shot or successive picosecond laser pulses at the NEODIM facility was obtained by direct measurements. The measurements were taken using an CXP8 streak camera (produced by the Research Institute of Pulse Techniques) with a picosecond time resolution under different operating conditions of the facility. The observed X-ray pulses had a half-height duration of 15-50 ps and a rise time of 5 ps at a ～1.5-ps duration of the effecting laser pulse. Under actual experimental conditions, it was ascertained that time dependences of the X-ray intensity could be recorded for more than 200 spatial elements on a single record at a sweep duration of 0.5 ns per frame and a time resolution of <5 ps.