A device for sample heating under high vacuum

摘要

A device for high-temperature heating of samples under high vacuum providing almost complete thermal insulation of the sample from the holder is described. The device allows the Si (111) 7×7 atomic structure to be studied without long-duration preliminary heat aging, whereas conventional heating systems require preliminary heat aging of the holder with the sample for several hours. The atomic structure was studied using a Solver P7-UHV SPM-MDT ultrahigh-vacuum scanning-probe microscope.