An X-ray Diffractometer with a Mobile Emitter-Detector System

摘要

An X-ray diffractometer with a mobile emitter-detector system is able to perform various X-ray examinations of a stationary sample. The design for this instrument is described, along with its operating principles and control programs. Owing to its high-precision angular movement sensors and its two detectors (one of these, a linear position-sensitive detector, has a working length of 100 mm and a resolution of <0.2 mm), the diffractometer can be used in both traditional and nontraditional experiments on X-ray reflection, scattering, and absorption. Results from using this instrument in reflectometry and X-ray tomography are presented as an example.