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Domain structure of epitaxial PbTiO3 thin films:effects of substrate selection and film thickness

机译:外延PbTiO3薄膜的畴结构:衬底选择和膜厚的影响

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摘要

The status of strain relaxation related with theformation of crystallographic twin domains in epitaxial PbTiO3thin films grown on various substrates such as MgO (001),KTaO3(100), and SrTiO3 (001) was extensively analyzed usingsynchrotron X-ray diffraction. Each system showed thecharacteristic domain structures depending on a thermos-elasticinteraction between the film and the substrate as reflected in thevalue of c/a ratio. Perfectly c-axis oriented PbTiO3 films wereobtained on SrTiO3 (001) substrates, while the films grown onKTaO3 (100) showed a-domain dominant structures with only abit amount of c-domains embedded in matrix a-domains.Thickness dependence of the domain structure was alsocharacterized for the films grown on MgO (001), in which degreeof c-axis orientation, α, increased as a function offilm thickness within a few tens of nm regionand exhibited a saturation value of ~~0.75above a certain critical film thickness.
机译:利用同步加速器X射线衍射分析了与在MgO(001),KTaO3(100)和SrTiO3(001)等各种衬底上生长的外延PbTiO3薄膜中晶体孪晶域的形成有关的应变松弛状态。每个系统都显示出特征域结构,这取决于膜与基材之间的热弹相互作用,如c / a比值所示。在SrTiO3(001)衬底上获得了完全沿c轴取向的PbTiO3膜,而在KTaO3(100)上生长的膜则显示了a-域支配结构,只有少量c-结构域嵌入基质a-结构域中。对于在MgO(001)上生长的薄膜,其特征也是如此,其中c轴取向度α在几十纳米区域内随薄膜厚度的变化而增加,并且在一定的临界薄膜厚度之上表现出~~ 0.75的饱和值。

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