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A Study on MgO-Ta_2O_5 System Ceramics for Microwave Component Application

机译:A Study on MgO-Ta_2O_5 System Ceramics for Microwave Component Application

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摘要

In this study, the microwave dielectric properties of the Mg_4Ta_2O_9 and Mg_5Ta_4O_(15) ceramics with composition ratio and sintering temperature were investigated and the dielectric resonators with these ceramics were simulated. TiO_a2 was doped in the Mg_4Ta_2O_9 ceramics for improvement of temperature property. The (1 - x)Mg_4Ta_2O_9-xTiO_2 and Mg_5Ta_4O_(15) ceramics were prepared by solid-state reaction method. According to the X-ray diffraction data, the (1 - x)Mg_4Ta_2O_9-xTiO_2 ceramics had main phase of the Mg_4Ta_2O_9 and MgTi_2O_5 peaks were appeared by additions of TiO_2. In the Mg_5Ta_4O_(15) ceramics, the Mg_4Ta_2O_9 and MgTa_2O_6 phase were coexisted and Mg_5Ta_4O_(15) phase was appeared with increments of sintering temperature. Microwave dielectric properties of (1 - x)Mg_4Ta_2O_9-xTiO2 ceramics were affected by MgTi_2O_5 and TiO_2 phase. The quality factor had a little decrement compared to pure Mg_4Ta_2O_9, but there was excellent improvement in TCRF by addition of TiO_2. Densifications of the Mg_4Ta_2O_9 and MgTa_2O_6 and existence of the Mg_5Ta_4O_(15) phase had influence on the microwave dielectric properties of the Mg_5Ta_4O_(15) ceramics. Dielectric constant, quality factor and TCRF of the (1 - x)Mg_4Ta_2O_9-xTiO_2 and Mg_5Ta_4O_(15) ceramics sintered at 1450℃ were 11.56-22.5, 24980-186410 GHz, -36.02~+19.72ppm/℃ and 8.2, 89473 GHz, -10.91 ppm/℃, respectively. ADS was used for simulation of DR. The simulated DR with the 0.5Mg_4Ta_2O_9-0.5TiO_2 and Mg_5Ta_4O_(15) ceramics had the S_(21) of -35.034 dB at 11.97 GHz and -28.493 dB at 10.50 GHz, respectively.

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