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Deformation behavior of polytetrafluoroethylene films under tensile stress at various temperatures

机译:聚四氟乙烯薄膜在不同温度下拉伸应力下的变形行为

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AbstractDeformation behavior of polytetrafluoroethylene (PTFE) films was investigated by thermomechanical analysis (TMA) under various tensile stresses (σ) up to 1.15 MPa in the temperature range from room temperature to 360°C. In the heating process above σ ≈ 0.25 MPa, a contraction of the PTFE film occurs in the melting temperature region. In the cooling process above σ ≈ 0.05 MPa, an elongation occurs in the crystallization temperature region, and above σ ≈ 0.5 MPa, it reaches 20–30 of the original length of the film. The PTFE films in the melt state above σ ≈ 0.5 MPa contract with increasing temperature up to 360°C and elongate with decreasing temperature. For the films that underwent deformation in the TMA, the crystalline orientation and the surface morphology were investigated by wide‐angle X‐ray diffraction and scanning electron microscopy, respectively. The degree of crystalline orientation in the deformed films increases with increasing σ and approaches a plateau at σ ≈ 0.4 MPa. On the surface of the deformed films, alignment of the bands and deformation of granules, which are formed by heat treatment above the melting point, are observed. ©
机译:摘要 在室温至360°C的温度范围内,通过热机械分析(TMA)研究了聚四氟乙烯(PTFE)薄膜在高达1.15 MPa的各种拉伸应力(σ)下的变形行为。 在σ ≈0.25 MPa以上的加热过程中,PTFE薄膜在熔融温度区域发生收缩。在σ ≈0.05 MPa以上的冷却过程中,结晶温度区发生伸长,在0.5 MPa σ ≈以上,达到薄膜原始长度的20-30%。熔融状态σ ≈0.5 MPa以上的聚四氟乙烯薄膜随温度升高而收缩至360°C,并随着温度的降低而伸长。对于TMA中发生变形的薄膜,分别采用广角X射线衍射和扫描电子显微镜研究了其晶体取向和表面形貌。变形薄膜中的结晶取向度随着σ的增加而增加,在σ ≈0.4 MPa时接近平台。在变形薄膜的表面上,观察到通过高于熔点的热处理形成的条带的排列和颗粒的变形。©

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