Differential scanning calorimetry (DSC) has been used to study solidhyphen;state amorphization and subsequent crystallization in sputtered multilayer Ni/Zr thin films. Initial results provide quantitative information about the thermodynamics and kinetics of these processes. An analysis of DSC data enables the activation energy and prehyphen;exponential factor for interdiffusion of Ni and Zr inahyphen;NiZr to be found.
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