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A method for quality control of water-soluble single crystals by X-ray diffractometry under heating

机译:一种加热下X射线衍射法控制水溶性单晶质量的方法

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摘要

For comparative quality control of crystals of the same material, a method is proposed in which the factor K = (I - I{sub}0)/I{sub}0 is taken as a measure of local perfection, where I{sub}0 is the initial integrated intensity of a selected diffraction peak of the crystal and I is the same intensity measured under mild heating conditions. The factor K, unlike the intensity I{sub}0, depends only slightly on the intensity of incident x-ray radiation. The crystal-averaged value of provides a measure of perfection of the crystal as a whole. The root-mean-square deviation <ΔK> characterizes the inhomogeneity of the crystal.
机译:为了对相同材料的晶体进行比较质量控制,提出了一种方法,其中将因子K =(I-I {sub} 0)/ I {sub} 0作为局部完善度的度量,其中I {sub} 0是晶体的选定衍射峰的初始积分强度,I是在温和加热条件下测得的相同强度。与强度I {sub} 0不同,因子K仅略微取决于入射X射线辐射的强度。 的晶体平均值提供了衡量晶体整体完整性的指标。均方根偏差<ΔK>表征晶体的不均匀性。

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