Positron trapping in plastically deformed Cd

摘要

Positron measurements, both lifetime and annihilation lineshape, have been performed in Cd, plastically deformed at room temperature by 40 and 60 thickness reductions. Less change in lineshape parameter for 60 deformation is observed. The annealing of 40 deformed sample between 25 and 200 T indicates the breaking up of dislocation network during recrystallisation process. (C) 2002 Elsevier Science Ltd. All rights reserved. References: 12