CHECKPOINT UNVEILS INFRASCAN ES400C-LW SOLUTION

摘要

Checkpoint Technologies, LLC has unveiled the InfraScan ES400C-LW for Testing and Failure Analysis. InfraScan ES400C-LW was developed to meet the demands of the newest lower power IC designs and architectures. These smaller geometries and lower voltages ICs require emission tools that are capable of seeing emissions that are further into the infrared regime than the traditional InGaAs cameras can detect. Checkpoint's newly designed MCT camera and optical system offers proprietary improvements for use with its solid immersion lens objective. This state-of-the-art design allows users 30-minute exposures of their devices. Checkpoint's MCT camera is capable of viewing emissions from 900 nm to 2500 run, allowing users to see photon emission and thermal imaging from the same tool. The new InfraScan ES400C-LW camera is equipped with an optical filter wheel that allows the user to select the appropriate emission regime for the design that is under test. In 2013, Checkpoint introduced the first production 3.3 NA SIL objective offering the highest NA available. Checkpoint's 3.3 NA SIL has been used successfully in the field for debugging 14 nm designs for over a year now. Checkpoint has also enhanced the illumination portion of the InfraScan ES400C-LW offering a 25% increase in optical resolution.