The infrared and Raman spectra of SiF4have been completely reexamined and extended. The Raman spectrum yields four lines at 268 cm−1, 390 cm−1, 800 cm−1, and 1010 cm−1, which have been assigned &ngr;2, &ngr;4, &ngr;1, and &ngr;3respectively. In the infrared measurements, both prism and grating spectrometers were utilized. Several bands reported in earlier work have been ascribed to impurities and nine new bands have been observed and identified. The long‐wave &ngr;4at 391 cm−1has been observed with a KRS−5 prism and its envelope determined. Bands involving &ngr;3appear to have aPRspacing of about 12 cm−1while those involving &ngr;4appear to have aPRspacing of about 20 cm−1.
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