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Electron and gamma irradiation-induced effects in poly(ethylene-co-tetrafluoroethylene) films

机译:电子和伽马辐照在聚(乙烯-共-四氟乙烯)薄膜中的影响

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摘要

The effect of high-energy radiation in poly(ethylene-co-tetrafluoroethylene) (ETFE) films has been extensively investigated. However, the microstructure and molecular changes of the film under different irradiation conditions are less well-understood. In this study, microstructure and molecular changes in ETFE films induced by gamma and electron irradiation with doses of 0-800 kGy are investigated using FTIR, UV-Vis, XRD, contact angle, SEM, and AFM measurements. The irradiated ETFE films show a linear dose-response relation in the dose range of 50-400 kGy. In particular, in the low doses of 50-150 kGy, the crystallization in the irradiated amorphous regions and the partial degradation of inherent crystalline layers are observed. In the irradiation doses higher than 150 kGy, the degradation of newly generated crystalline areas and the recrystallization of disordering regions take place. Moreover, the microstructure alterations occur within the bulk and at the surface of the irradiated films. The 2-year shelf-aged films exhibit the partial preservation of chemical structures with the low oxidation effects, plus the features of linear dose-response with doses of 50-400 kGy. The obtained results provide a further understanding of radiation-induced effects in the ETFE films, which is the basic to extend their applications, especially in radiation resistance and dosimetry.
机译:高能辐射对聚(乙烯-共四氟乙烯)(ETFE)薄膜的影响已得到广泛研究。然而,不同辐照条件下薄膜的微观结构和分子变化却鲜为人知。在这项研究中,使用FTIR、UV-Vis、XRD、接触角、SEM和AFM测量研究了伽马射线和电子辐照(剂量为0-800 kGy)诱导的ETFE薄膜的微观结构和分子变化。辐照的ETFE薄膜在50-400 kGy的剂量范围内显示出线性剂量反应关系。特别是,在50-150 kGy的低剂量下,观察到辐照非晶区域的结晶和固有结晶层的部分降解。在高于 150 kGy 的辐照剂量下,会发生新生成的结晶区域的降解和无序区域的重结晶。此外,微观结构的改变发生在被辐照薄膜的主体内部和表面。2年陈化薄膜具有部分化学结构保留和低氧化效应,以及剂量为50-400 kGy的线性剂量反应特征。所获得的结果为ETFE薄膜中辐射诱导效应的进一步理解提供了进一步的理解,这是扩展其应用的基础,特别是在抗辐射性和剂量测定方面。

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