Passive solid-state detectors based on the visible radiophotoluminescence (RPL) of stable aggregate F-2 and F-3 (+) color centers in lithium fluoride (LiF) are successfully used for X-ray imaging and advanced diagnostics of intense X-rays sources. Among their advantages, these detectors offer a wide dynamic range and simplicity of use. They can be read non-destructively using a fluorescence microscope, enabling high spatial resolution over a large field of view. Optically transparent LiF films, of three different increasing thicknesses, were grown by thermal evaporation on glass and silicon substrates and subsequently irradiated with monochromatic 7 keV X-rays at several doses from 1.3 x 10(1) to 4.5 x 10(3 )Gy at the SOLEIL synchrotron facility. For all the LiF films, the RPL response was found to depend linearly on the irradiation dose, with films grown on Si(100) substrates exhibiting up to a 50% higher response compared to those grown on glass. A minimum dose of 13 Gy was detected, despite the low thickness of the irradiated films. The limited thickness of the homogeneously colored LiF film allowed to obtain a spatial resolution of (0.44 & PLUSMN; 0.04) & mu;m in edge-enhancement imaging experiments conducted by placing an Au mesh in front of the samples.
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