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Conserved Markers Order in Quantitative Trait Loci Confers Resistance against Black Root Rot Disease in Cotton

机译:Conserved Markers Order in Quantitative Trait Loci Confers Resistance against Black Root Rot Disease in Cotton

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摘要

Background and objective: Black root rot, incited by the soil bo ne fungus Thielasis basicola, can cause substantial yield loss and reduced fiber quality in co on (Gossypium spp.). The isolation of candidate resistant genes in tetraploid genome AADd cotto. pecies (=4x=52) remains challenging in the absence of research of black root rot resistance on progenitor DD genome diploid cotton (G. raimondii). In this study, by exp Mting Phytoz me database, a comparative map of the black root rot-resistance quanti ative t. it loci in DD genome was constructed. Materials and methods: Simple sequence repeats mark _ acsociated with these three quantitative trait loci in the AA genome wer' used as "anchored-probes” frameworks for establishing relationships between the two cotton genomes AA and DD. Results: Our results showed that there was colinearity between the genetic map of simple sequence repeats markers on AA genome and the physical map of these simple sequence repeats markers on DD genome. It was suggested that the syntenic loci on chi ’osome 2,i on DD genome could correspond the black root rot resistance. Conclusion . study could serve as a fundamental step in isolating and introducing the resistance gene against black root rot into elite cotton cultivars.

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