Facet reflectivity in the presence of a diffracting corner

摘要

Results and new theory are presented for the uncoated and coated facet reflectivity of a shallowly buried waveguide, taking account of the diffracting corner present at the air-semiconductor interface. The corner effects are shown to be most significant in the case of coated facets. The analysis also predicts the asymmetry introduced into the radiation pattern.