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Development of a Small-Scale High-Speed System of Measuring Defectoscopy and Its Testing on Different Objects

机译:Development of a Small-Scale High-Speed System of Measuring Defectoscopy and Its Testing on Different Objects

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摘要

Abstract An approach has been developed to the synthesis of systems for measuring the shape of hard-to-reach parts with obtaining information about the three-dimensional shape. Existing methods and installations for solving such problems are considered. A prototype of a small-sized high-speed system for measuring flaw detection was obtained using the proposed approach. The method of stereo reconstruction using structured laser illumination is considered, which makes it possible to obtain information about the three-dimensional shape of a smooth surface the image of which does not have a sharp contrast drop. The system was tested on model objects.

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