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Experimental study of the effects of a six-level phase mask on a digital holographic storage system

机译:六级相位掩模对数字全息存储系统影响的实验研究

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摘要

We measure the M/# and the bit-error rate of a digital holographic storage system with a 4f optical arrangement for three configurations: recording at the Fourier plane with and without a phase mask and recording outside the Fourier plane without a phase mask. Unexpectedly, no significant change in the dynamic range was observed when a phase mask was used to record in thick crystals. However, we show that a phase mask is a key component in a 4f digital holographic storage system if high-fidelity holograms with optimum volumetric density are to be stored. (C) 1998 Optical Society of America. [References: 20]
机译:我们针对以下三种配置测量具有4f光学配置的数字全息存储系统的M /#和误码率:在具有和不具有相位掩模的情况下在傅立叶平面上记录以及在没有相位掩模的情况下在傅立叶平面外进行记录。出乎意料的是,当使用相位掩模记录厚晶体时,没有观察到动态范围的显着变化。但是,我们表明,如果要存储具有最佳体积密度的高保真全息图,则相位掩模是4f数字全息存储系统中的关键组件。 (C)1998年美国眼镜学会。 [参考:20]

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