Optical characterization of titania thin films produced by the solgel method and doped with Co2+ at different concentrations

摘要

We report some preliminary results on the fabrication and optical characterization of high-refractive-index thin films of titania doped with Co2+ These films were supported on silica plates that were chemically activated to attach both phases. The titania films were produced by the solgel method at room temperature and slowly annealed from room temperature to 230 degrees C; their thickness was approximately 600 Angstrom. The optical characterizations were obtained by the use of spectroscopic ellipsometry, where the dielectric function of the material was obtained as a function of the wavelength. Additionally, the ellipsometric function was modeled to obtain the porosity of the films and their thickness. (C) 1998 Optical Society of America. [References: 19]