Anisotropic Exchange Stiffness Constant of Exchange Biased MnIr/NiFe Thin Film

摘要

The ferromagnetic resonance field and spin wave resonance field with in-plane angles Φ_H were measured in order to analyze the angular dependence of exchange stiffness constant A_(ex) in exchange biased MnIr/NiFe thin film. The A_(ex) of MnIr/NiFe thin film showed an anisotropic behavior such as A_(ex)= A_0 +A_(eb)cosΦ_H. The isotropic exchange stiffness constant A_0 was due to the exchange stiffness constant of NiFe, while anisotropic exchange stiffness constant A_(eb) was due to the exchange bias field.