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首页> 外文期刊>Boletin de la Sociedad Espanola de Ceramica y Vidrio >Processing of Samarium Doped Ceria for IT-SOFC. Grain Boundary Effect on the Electrical Conductivity
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Processing of Samarium Doped Ceria for IT-SOFC. Grain Boundary Effect on the Electrical Conductivity

机译:用于IT-SOFC的mar掺杂二氧化铈的处理。晶界对电导率的影响

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Nanometric powders of ceria doped with 10, 15 and 20% at. of samarium were prepared by a sol-gel method. The powders were compacted in cylindrical pellets and sintered at different temperatures in order to obtain grain sizes ranging from 1 to 10 microns. The electrical conductivity was measured in air by electrochemical impedance spectroscopy in the 1166 - 473 K temperature range. The bulk and grain boundary contributions to the overall conductivity were estimated by equivalent circuit analysis and the application of the brick layer model. While bulk conductivity values were markedly independent of the grain size, a relevant decrease in the grain boundary specific conductivity was observed for the finer grain samples in the lower dopant grade. For increased samarium content, this decrease in specific grain boundary conductivity with grain size becomes less relevant.
机译:掺杂10%,15%和20%at。的二氧化铈纳米粉末。 mar通过溶胶-凝胶法制备。将粉末压制成圆柱形丸粒,并在不同温度下烧结,以获得1至10微米的粒度。通过电化学阻抗谱在1166-473 K温度范围内在空气中测量电导率。通过等效电路分析和砖层模型的应用来估算体积和晶界对总电导率的贡献。虽然体电导率值明显与晶粒尺寸无关,但是对于较低掺杂物等级的较细晶粒样品,观察到了晶界比电导率的相应降低。随着increased含量的增加,这种特定的晶界电导率随晶粒尺寸的减小变得不那么重要。

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