Surface Characterization of Atactic Poly(methyl methacrylate) Aggregates Using Atomic Force Microscopy

摘要

Stereoregular poly(methyl methacrylate) (PMMA) recently has been attractive to many researchers. For the mixture of isotactic and syndiotactic poly(methyl methacrylate) (i-PMMA and s-PMMA) leads to formation of a stereocomplex which was revealed a double stranded helical structure in suitable solvents.~1,2 As for atactic poly(methyl methacrylate), Spevacek et al. and Borchard et l. proved that stereocopmlex was able to form in its solution.~(3-5) And a stereocomplex was also found in atatic PMMA film from strong complexing solvent acetone.~6,7 In this note, the effects of solvent and substrate on the patterning of a-PMMA aggregates were studied using by atomic force microscopy (AFM).