Appointing of surface topography parameters to describe the diffuse reflective properties of selected dielectrics

摘要

The investigations have been performed in order to choose the specific roughness parameters, which would inform the customer about the diffuse emissive and reflective characteristics of the adhesive tapes used in the thermographtc measurements. To achieve that, a series of the surface topography parameters of various adhesive tapes (i.e. objects with diffusive reflective characteristics) and various glass plates (i.e. objects with directional reflective characteristics) has been examined. For the analysis of surface topography the following parameters were selected: Sdr (the Developed Interfacial Area Ratio) and Sdq (the Root Mean Square Surface Slope). These selected parameters seem to be most suitable to describe the properties of the surface in the discussed aspect.