Characterization of durable nanostructured thin film catalysts tested under transient conditions using analytical aberration-corrected electron microscopy

摘要

The stability of Ru0.1Ir0.9 oxidation evolution reaction (OER) catalysts deposited on Pt-coated nanostructured thin films (NSTFs) has been investigated by aberration-corrected electron microscopy. Accelerated stress tests showed that the OER catalysts significantly improved the durability of the Pt under cell reversal conditions. High-resolution images of the end-of-life NSTFs showed significant Ir loss from the whisker surfaces, while no Pt loss was observed. The retention of the Pt indicated that the OER catalysts had protected the catalyst-coated whisker surfaces from degradation.