Empirical Loss Timescales of Slot Region Electrons due to Plasmaspheric Hiss Based on Van Allen Probes Observations

摘要

Based on Van Allen Probes observations, in this study we perform a statistical analysis of the spectral intensities of plasmaspheric hiss at L-shells of 1.8-3.0 in the slot region. Our results show that slot region hiss power intensifies with a strong day-night asymmetry as the level of substorm activity or L-shell increases. Using the statistical spectral profiles of plasmaspheric hiss, we calculate the drift- and bounce-averaged electron pitch angle diffusion coefficients and subsequently obtain the resultant electron loss timescales through 1-D Fokker-Planck simulations. We find that slot region electron loss timescales vary significantly from <1 day to several years, showing a strong dependence on electron energy, L-shell and substorm activity. We also construct an empirical model of slot region electron loss timescales due to scattering by plasmaspheric hiss, which agrees well with the 1-D simulation results and can be readily used in modeling the dynamics of slot region electrons.